Time-of-check Time-of-use (TOCTOU) Race Condition in DSP Service (Qualcomm, Inc. Snapdragon)

CVE-2026-25271
HIGH 7.8

At a glance

Source
NVD
EPSS
EPSS 0.07 % · percentile 0 ()
State
PUBLISHED
Published
Updated
Assigner
qualcomm
NVD status
Analyzed

Description

Memory Corruption when processing asynchronous input parameters due to improper handling of modified values between check and use.

Weaknesses (CWE)

  • CWE-367 — Time-of-check Time-of-use (TOCTOU) Race Condition

References

Scores

VersionScoreVectorScored by
CVSS 3.1HIGH 7.8CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:Hqualcomm
CVSS 3.1HIGH 7.8CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:HNVD · product-security@qualcomm.com (Secondary)
CVSS 3.1HIGH 7.0CVSS:3.1/AV:L/AC:H/PR:L/UI:N/S:U/C:H/I:H/A:HNVD · nvd@nist.gov (Primary)

European references

Affected configurations (NVD CPE)

Affected products

ProductVersions
Qualcomm, Inc. · Snapdragonaffected Cologne ; affected FastConnect 6900 ; affected FastConnect 7800 ; affected IQX5121 ; affected IQX7181 ; affected QCA0000

Sources

SourceLicence
CVE List (CVEProject cvelistV5)CVE Program Terms of Use
EPSS (FIRST.org)FIRST — attribution requested
ENISA EUVDENISA — reproduction authorised, source acknowledged
NVD (NIST) via fkie-cad/nvd-json-data-feedsPublic domain — this product uses data from the NVD API but is not endorsed or certified by the NVD