Exposed Dangerous Method or Function in HLOS (Qualcomm, Inc. Snapdragon)

CVE-2025-47366
HIGH 7.1

At a glance

Source
NVD
EPSS
EPSS 0.10 % · percentile 1 ()
State
PUBLISHED
Published
Updated
Assigner
qualcomm
NVD status
Analyzed

Description

Cryptographic issue when a Trusted Zone with outdated code is triggered by a HLOS providing incorrect input.

Weaknesses (CWE)

  • CWE-749 — Exposed Dangerous Method or Function

References

Scores

VersionScoreVectorScored by
CVSS 3.1HIGH 7.1CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:Nqualcomm
CVSS 3.1HIGH 7.1CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:NNVD · product-security@qualcomm.com (Secondary)
CVSS 3.1HIGH 7.8CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:HNVD · nvd@nist.gov (Primary)

European references

CERT-FR advisories

Affected configurations (NVD CPE)

Affected products

ProductVersions
Qualcomm, Inc. · Snapdragonaffected AR8035 ; affected FastConnect 6200 ; affected FastConnect 6700 ; affected FastConnect 6900 ; affected FastConnect 7800 ; affected Flight RB5 5G Platform

Sources

SourceLicence
CVE List (CVEProject cvelistV5)CVE Program Terms of Use
EPSS (FIRST.org)FIRST — attribution requested
ENISA EUVDENISA — reproduction authorised, source acknowledged
CERT-FR (ANSSI)Licence Ouverte / Etalab 2.0
NVD (NIST) via fkie-cad/nvd-json-data-feedsPublic domain — this product uses data from the NVD API but is not endorsed or certified by the NVD