Qualcomm, Inc. Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables

CVE-2022-25696
HIGH 8.4

En bref

Source
NVD
EPSS
EPSS 0.09 % · centile 0 ()
État
PUBLISHED
Publiée
Mise à jour
Attribuée par
qualcomm
Statut NVD
Modified

Description

Memory corruption in display due to time-of-check time-of-use race condition during map or unmap in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables

Faiblesses (CWE)

  • CWE-367 — Situation de compétition TOCTOU

Références

Scores

VersionScoreVecteurÉvalué par
CVSS 3.1HIGH 8.4CVSS:3.1/AV:L/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:Hqualcomm
CVSS 3.1HIGH 8.4CVSS:3.1/AV:L/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:HNVD · product-security@qualcomm.com (Secondary)
CVSS 3.1HIGH 7.0CVSS:3.1/AV:L/AC:H/PR:L/UI:N/S:U/C:H/I:H/A:HNVD · nvd@nist.gov (Primary)

Références européennes

Avis du CERT-FR

Configurations affectées (CPE NVD)

Produits affectés

ProduitVersions
Qualcomm, Inc. · Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearablesaffected APQ8053, AQT1000, MSM8953, QCA6390, QCA6391, QCA6420, QCA6430, QCA6574, QCA6574A, QCA6574AU, QCA6595AU, QCA6696, QCM2290, QCM4290, QCM6490, QCS2290, QCS4290, QCS6490, Qualcomm215, SA6155P, SA8155P, SA8195P, SD 675, SD 8 Gen1 5G, SD439, SD460, SD480, SD662, SD665, SD670, SD675, SD678, SD680, SD690 5G, SD695, SD710, SD720G, SD730, SD750G, SD765, SD765G, SD768G, SD778G, SD780G, SD855, SD865 5G, SD870, SD888, SD888 5G, SDX50M, SDX55, SDX55M, SM4125, SM6250, SM7250P, SM7315, SM7325P, SM7450, SM8475, SM8475P, SW5100, SW5100P, WCD9326, WCD9335, WCD9341, WCD9370, WCD9375, WCD9380, WCD9385, WCN3615, WCN3660B, WCN3680B, WCN3910, WCN3950, WCN3980, WCN3988, WCN3990, WCN3991, WCN3998, WCN6740, WCN6750, WCN6850, WCN6851, WCN6855, WCN6856, WCN7850, WCN7851, WSA8810, WSA8815, WSA8830, WSA8832, WSA8835

Sources

SourceLicence
CVE List (CVEProject cvelistV5)CVE Program Terms of Use
EPSS (FIRST.org)FIRST — attribution requested
ENISA EUVDENISA — reproduction authorised, source acknowledged
CERT-FR (ANSSI)Licence Ouverte / Etalab 2.0
NVD (NIST) via fkie-cad/nvd-json-data-feedsPublic domain — this product uses data from the NVD API but is not endorsed or certified by the NVD