Qualcomm, Inc. Snapdragon Mobile, Snapdragon Wear

CVE-2018-5881
HIGH 8.8

En bref

Source
NVD
EPSS
EPSS 0.43 % · centile 37 ()
État
PUBLISHED
Publiée
Mise à jour
Attribuée par
qualcomm
Statut NVD
Modified

Description

Improper validation of buffer length checks in the lwm2m device management protocol can leads to a buffer overflow in snapdragon mobile and snapdragon wear in versions MDM9206, MDM9607, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 450, SD 625, SD 636, SD 835, SDA660, SDM630, SDM660

Faiblesses (CWE)

  • CWE-119 — Opération hors des limites d'un tampon mémoire

Références

Scores

VersionScoreVecteurÉvalué par
CVSS 3.0HIGH 8.8CVSS:3.0/AV:A/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:HNVD · nvd@nist.gov (Primary)
CVSS 2.0HIGH 8.3AV:A/AC:L/Au:N/C:C/I:C/A:CNVD · nvd@nist.gov (Primary)

Références européennes

Configurations affectées (CPE NVD)

Produits affectés

ProduitVersions
Qualcomm, Inc. · Snapdragon Mobile, Snapdragon Wearaffected MDM9206, MDM9607, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 450, SD 625, SD 636, SD 835, SDA660, SDM630, SDM660

Sources

SourceLicence
CVE List (CVEProject cvelistV5)CVE Program Terms of Use
EPSS (FIRST.org)FIRST — attribution requested
ENISA EUVDENISA — reproduction authorised, source acknowledged
NVD (NIST) via fkie-cad/nvd-json-data-feedsPublic domain — this product uses data from the NVD API but is not endorsed or certified by the NVD