Qualcomm, Inc. Snapdragon Mobile, Snapdragon Wear

CVE-2018-5879
HIGH 8.8

At a glance

Source
NVD
EPSS
EPSS 0.43 % · percentile 37 ()
State
PUBLISHED
Published
Updated
Assigner
qualcomm
NVD status
Modified

Description

Improper length check while processing an MQTT message can lead to heap overflow in snapdragon mobile and snapdragon wear in versions MDM9206, MDM9607, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 450, SD 625, SD 636, SD 835, SDA660, SDM630, SDM660

Weaknesses (CWE)

References

Scores

VersionScoreVectorScored by
CVSS 3.0HIGH 8.8CVSS:3.0/AV:A/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:HNVD · nvd@nist.gov (Primary)
CVSS 2.0HIGH 8.3AV:A/AC:L/Au:N/C:C/I:C/A:CNVD · nvd@nist.gov (Primary)

European references

Affected configurations (NVD CPE)

Affected products

ProductVersions
Qualcomm, Inc. · Snapdragon Mobile, Snapdragon Wearaffected MDM9206, MDM9607, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 450, SD 625, SD 636, SD 835, SDA660, SDM630, SDM660

Sources

SourceLicence
CVE List (CVEProject cvelistV5)CVE Program Terms of Use
EPSS (FIRST.org)FIRST — attribution requested
ENISA EUVDENISA — reproduction authorised, source acknowledged
NVD (NIST) via fkie-cad/nvd-json-data-feedsPublic domain — this product uses data from the NVD API but is not endorsed or certified by the NVD