Qualcomm Technologies, Inc. Snapdragon Automobile, Snapdragon Mobile, Snapdragon Wear

CVE-2017-18274
HIGH 7.8

At a glance

Source
NVD
EPSS
EPSS 0.24 % · percentile 15 ()
State
PUBLISHED
Published
Updated
Assigner
qualcomm
NVD status
Modified

Description

While iterating through the models contained in a fixed-size array in the actData structure, which also stores an incorrect number of models that is greater than the size of the array, a buffer overflow occurs in Snapdragon Automobile, Snapdragon Mobile, Snapdragon Wear in MDM9206, MDM9607, MDM9650, SD 210/SD 212/SD 205, SD 425, SD 430, SD 450, SD 617, SD 625, SD 650/52, SD 820, SD 820A, SD 835

Weaknesses (CWE)

  • CWE-129 — Improper Validation of Array Index

References

Scores

VersionScoreVectorScored by
CVSS 3.0HIGH 7.8CVSS:3.0/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:HNVD · nvd@nist.gov (Primary)
CVSS 2.0HIGH 7.2AV:L/AC:L/Au:N/C:C/I:C/A:CNVD · nvd@nist.gov (Primary)

European references

CERT-FR advisories

Affected configurations (NVD CPE)

Affected products

ProductVersions
Qualcomm Technologies, Inc. · Snapdragon Automobile, Snapdragon Mobile, Snapdragon Wearaffected MDM9206 ; affected MDM9607 ; affected MDM9650 ; affected SD 210/SD 212/SD 205 ; affected SD 425 ; affected SD 430

Sources

SourceLicence
CVE List (CVEProject cvelistV5)CVE Program Terms of Use
EPSS (FIRST.org)FIRST — attribution requested
ENISA EUVDENISA — reproduction authorised, source acknowledged
CERT-FR (ANSSI)Licence Ouverte / Etalab 2.0
NVD (NIST) via fkie-cad/nvd-json-data-feedsPublic domain — this product uses data from the NVD API but is not endorsed or certified by the NVD